VNR for Russian Association of forensic experts

VNR for Russian Association of forensic experts New version of Visual NAND Reconstructor 2.0 keeps generating a lot of interest from data recovery professionals all over the world. Rusolut held one more presentation of the latest version of VNR for Russian Association of forensic experts together with LAN-Project. Our developers demonstrated VNR unique features for working…

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Visual NAND Reconstructor 2.0 update

Visual NAND Reconstructor 2.0 update Dear Friends! We are getting more and more requests from our users to develop technology or tool for data recovery and forensics of broken smartphones. And this is obvious trend: nowadays people around the world store more and more vital data on the portable gadgets such a smartphones, tables, etc.  As…

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Series of trainings in Canada is completed!

Series of trainings in Canada is completed! Dear Friends! We would like to tell you the brief story about our Canadian trip. As you know we conducted a series of Rusolut Chip-off Training Classes in Toronto and we are eager to share with you how great it was! These trainings gathered together forensic experts from…

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Software update 14 June 2016

Software update 14 June 2016 The new update 1.4.0.8 is released! In this update we have significantly improved the work with memory chips and physical image extraction. Now it’s possible to reread problematic areas with bad pages several times automatically even through bad columns! There are many new devices and NAND chips have been added to…

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19th TAPT Conference “Technical Aspects of Cyber Crime”

19th TAPT Conference “Technical Aspects of Cyber Crime” Dear Friends! We are proud to inform you that Rusolut’s team took a part in the 19th TAPT Conference “Technical Aspects of Cyber Crime”! This Conference gathered forensic experts from different Police agencies of Poland and some other European law enforcement agencies. In our presentation we demonstrated…

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ECC in NAND flash memory

ECC in NAND flash memory The modern flash devices have a very common problem of data integrity caused by low quality of NAND chips. This problem is well known as “Bit errors”. When bit errors appear on the area where file is stored, it gets corrupted and unreadable. It’s very noticeable on multimedia files. There…

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NAND Bad Columns analysis and removal

NAND Bad Columns analysis and removal These vertical stripes are Bad Columns. Number of Bad columns within one page can be any, on practise 1…80 defects/columns (2…160 bytes per page). Typical size of bad columns is 2 bytes, rarely 1 byte, sometimes they are grouped together as 4,6 and more bytes. A distrubution of bad…

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Software update 15 Feb 2016

Software update 15 Feb 2016 The new update 1.4.0.1 is released! It is available in Client Portal Here’s what we added in new VNR software New software New optimized firmware of reader The new element “Bad column remover” (BCR) The new option in NAND parameters “Micron Read Retry” for bit error minimization. The value may vary from 0 to 15.…

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